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IEEE 1687-IEEE Standard for Access and Control of Instrumentation Embedded

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
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Description

IEEE 1687 is an active IEEE standard that defines a way to access monitoring data inside an integrated circuit using the IEEE 1149.1 test access port (TAP) or other additional means. The standard does not define the instruments or features for accessing the data. Often known as internal JTAG, or IJTAG, the standard provides a more comprehensive set of control capabilities for setting up and managing the tests of various internal blocks.

IJTAG enabled the use of a separate set of pins for loading data more quickly. No one wants to dedicate pins to testing, so by multiplexing functional pins for testing, one can choose a number of pins to use for loading data without commanding any physical footprint. Care must be taken, however, to ensure this muxing doesn’t affect the performance of any high-speed or analog signals.

That standard was approved in 2014. IEEE 1687-2014 is the IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device. The Internal Joint Test Action Group (IJTAG) worked on the standard. According to the IEEE SA page for 1687, included in the standard are a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.


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