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Part Average Testing (PAT)

Outlier detection for a single measurement, a requirement for automotive electronics.
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Description

Part Average Testing, or PAT, is used for outlier detection for a single measurement, a requirement for automotive electronics, found in the Automotive Electronics CouncilsAEC – Q001 Rev-D guidelines. Parts with abnormal characteristics — or outliers — significantly contribute to quality and reliability problems. Finding outliers is important to reliability of automotive electronics.

Tests can be limited either dynamically or statically. Static test limits are based on an available amount of test data and covers several lots at at time. The data is used without modification for period of time, whereas dynamic test limits are established for each lot (or wafer in a lot) and continuously modified as each lot (or wafer) is tested, according to the guidelines. Dynamic makes for tighter limits without causing rejection of good parts.

The AEC -Q001 RevD says that using the PAT technique flags process shifts and provides a source of rapid feedback that should prevent quality accidents.